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X-Ray diffraction analysis of bandgap-engineered distributed bragg reflectors

โœ Scribed by S. G. Patterson; G. S. Petrich; R. J. Ram; L. A. Kolodziejski


Book ID
107458042
Publisher
Springer US
Year
1999
Tongue
English
Weight
145 KB
Volume
28
Category
Article
ISSN
0361-5235

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The x-ray diffraction line profiles of the 002 reflections of graphite samples ground in a ball mill for periods up to 90 hours were studied using newly developed peak analysis methods that permitted separation of overlapping peaks having different peak positions, intensities, and line-breadths. For