High-resolution X-ray diffraction analysis of the Bragg peak integrated intensity in highly mismatched III-N epilayers

✍ Scribed by G. Feng; X.M. Shen; J.J. Zhu; B.S. Zhang; D.G. Zhao; Y.T. Wang; H. Yang; J.W. Liang

• Book ID: 108341872
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 103 KB
• Volume: 250
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/s0022-0248(02)02477-6