X-ray diffraction analysis fo GaAs/AlAs multilayer structures grown by molecular beam epitaxy on (311) and (210) GaAs surfaces

✍ Scribed by M.A. Tagliente; L. De Caro; L. Tapfer; R. Nötzel; A. Fischer; K. Ploog

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 372 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90291-7