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X-ray determination of thermal lattice expansion of CuSi2 + xP3 (x = 1, 2) at elevated temperatures

โœ Scribed by Dr. G. Bhikshamaiah; M. S. Omar; S. V. Suryanarayana


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
221 KB
Volume
29
Category
Article
ISSN
0232-1300

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๐Ÿ“œ SIMILAR VOLUMES


Determination of lattice parameters and
โœ G. Bhikshamaiah; S. Annapurna; A. K. Singh ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 103 KB

CuGe 2 P 3 is a p-type semiconductor with zincblende structure. Ge 3 P 4 is soluble up to 35 mole % in CuGe 2 P 3 . Lattice parameters of CuGe 2 P 3 + 0.2 Ge 3 P 4 have been determined at elevated temperatures from room temperature to 873 K using the x-ray diffraction profiles ( 111), ( 200), ( 220)

ChemInform Abstract: Preparation, X-Ray