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X-Ray Characterization of Low-Thermal-Conductivity Thin-Film Materials

✍ Scribed by Paul Zschack; Colby Heideman; Clay Mortensen; Ngoc Nguyen; Mary Smeller; Qiyin Lin; David C. Johnson

Book ID: 107455398
Publisher: Springer US
Year: 2009
Tongue: English
Weight: 309 KB
Volume: 38
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-009-0679-5

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