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X-ray characterization of CdO thin films grown on a-, c-, r- and m-plane sapphire by metalorganic vapour phase-epitaxy

✍ Scribed by J. Zúñiga-Pérez; C. Martínez-Tomás; V. Muñoz-Sanjosé

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 257 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200460672

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