X-ray and transmission electron microscopy characterization of twinned CdO thin films grown ona-plane sapphire by metalorganic vapour phase epitaxy

✍ Scribed by M.C. Martínez-Tomás; J. Zúñiga-Pérez; P. Vennéguès; O. Tottereau; V. Muñoz-Sanjosé

• Publisher: Springer
• Year: 2007
• Tongue: English
• Weight: 334 KB
• Volume: 88
• Category: Article
• ISSN: 1432-0630
• DOI: 10.1007/s00339-007-3977-x