X-ray beam induced current—a synchrotron radiation based technique for the in situ analysis of recombination properties and chemical nature of metal clusters in silicon

✍ Scribed by Vyvenko, O. F.; Buonassisi, T.; Istratov, A. A.; Hieslmair, H.; Thompson, A. C.; Schindler, R.; Weber, E. R.

• Book ID: 111892954
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 545 KB
• Volume: 91
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1450026