X-Ray and Resistivity Studies on Ag5Pb2-xMxO6 (M = Bi3+, In3+)

✍ Scribed by M. Bortz; M. Jansen; H. Hohl; E. Bucher

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 99 KB
• Volume: 103
• Category: Article
• ISSN: 0022-4596
• DOI: 10.1006/jssc.1993.1121

✦ Synopsis

By reacting (\mathrm{Ag}{2} \mathrm{O}) and (\mathrm{PbO}{2}) with (\mathrm{AgBiO}{3}) and (\mathrm{In}{2} \mathrm{O}{3}), respectively, at temperatures between 770 and (820 \mathrm{~K}) and oxygen pressures of (100 \mathrm{MPa}) for 4 days, mixed crystals according to the formula (\mathrm{Ag}{9} \mathrm{~Pb}{2-x}) (M{x} \mathrm{O}{6}\left(M=\mathrm{Bi}^{3+}\right.) and (\left.\operatorname{In}^{3+}\right)) in the stability range from (x=0) to (x=1\left(\ln x{\max }=0.75\right)) were formed. As characterized by X-ray powder diffractometry the substitution of (\mathrm{Bj}^{3+}) for (\mathrm{Pb}^{4+}) leads to an increase of the cell volume from 196.4 (undoped sample) to (200.4 \AA^{3}(x=1)), while (\mathrm{I}^{3+}) decreases it to 189.9 (\AA^{3}). As their metallic behavior is lost, the resistivity of the Bi-doped compounds grows drastically with increasing Bi-content, while In-doping shows only a small increase in resistivity. 1993 Academic Press. Inc.