The ScanningβTunneling Microscopy, the X
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Youichi Ohno
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Article
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1999
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Elsevier Science
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English
β 477 KB
The Ta N 6,7 and Te N 4,5 inner-shell-electron energy-loss spectroscopy (ISEELS) spectra and the X-ray photoelectron spectroscopy (XPS) spectra in layered transition-metal ditellurides MTe 2 (M β«Ψβ¬ Ta, Nb) for which metal d-derived conduction bands overlap Te 5p valence bands significantly, have bee