𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray analysis of heat-treated titanium nitride films

✍ Scribed by V. Valvoda; R. Černý; R. Kužel Jr.; L. Dobiášová; J. Musil; V. Poulek; J. Vyskočil


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
505 KB
Volume
170
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


X-ray Photoelectron Spectroscopy Depth P
✍ Butcher, K. S. A.; Tansley, T. L.; Li, Xin 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 359 KB 👁 2 views

Aluminium nitride thin Ðlms grown at room temperature on degenerate silicon (conducting) substrates have been studied using XPS. The hydrolysis layer at the surface of the AlN was examined using valence band measurements, and the e †ect of 5 kV argon ion milling used to remove the hydrolysis layer w

Thin Film Analysis by X-Ray Scattering (
✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr