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X-ray acoustic topography of defects in Si crystals

✍ Scribed by Fodchuk, I. ;Novikov, S. ;Fedortsov, D.

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 440 KB
Volume: 201
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.200306764

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