X-ray absorption resonance spectroscopy as a local probe of the electronic structure at metal-semiconductor interfaces and silicide: Pt/Si, Pd/Si, and Yb/Si

✍ Scribed by G. Rossi; P. Roubin; D. Chandesris; J. Lecante

• Book ID: 118361672
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 347 KB
• Volume: 168
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(86)90910-6