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X-ray absorption resonance spectroscopy as a local probe of the electronic structure at metal-semiconductor interfaces and silicides: Pt/Si, Pd/Si, and Yb/Si

✍ Scribed by G. Rossi; P. Roubin; D. Chandesris; J. Lecante


Publisher
Elsevier Science
Year
1986
Weight
44 KB
Volume
168
Category
Article
ISSN
0167-2584

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