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X-ray absorption near edge spectroscopy from reflection x-ray absorption fine structure under the grazing incidence conditions

✍ Scribed by Katsuhiko Tani; Noriyuki Iwata; Toshihiko Mitsueda; Masato Ueha; Hideo Saisho; Hiroshi Iwasaki

Book ID
108261505
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
438 KB
Volume
59
Category
Article
ISSN
0584-8547

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Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel t