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Worst-case bias during total dose irradiation of SOI transistors

โœ Scribed by Ferlet-Cavrois, V.; Colladant, T.; Paillet, P.; Leray, J.L.; Musseau, O.; Schwank, J.R.; Shaneyfelt, M.R.; Pelloie, J.L.; du Port de Poncharra, J.


Book ID
111882230
Publisher
IEEE
Year
2000
Tongue
English
Weight
133 KB
Volume
47
Category
Article
ISSN
0018-9499

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