Worst-case bias during total dose irradiation of SOI transistors

✍ Scribed by Ferlet-Cavrois, V.; Colladant, T.; Paillet, P.; Leray, J.L.; Musseau, O.; Schwank, J.R.; Shaneyfelt, M.R.; Pelloie, J.L.; du Port de Poncharra, J.

• Book ID: 111882230
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 133 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.903751