Worst case total dose radiation response of 0.35 μm SOI CMOSFETs

✍ Scribed by Liu, S.T.; Balster, S.; Sinha, S.; Jenkins, W.C.

• Book ID: 111937347
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 469 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.819159