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Worst-case and average-case analysis of n-detection test sets and test generation strategies

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID: 117809979
Publisher: The Institution of Engineering and Technology
Year: 2007
Tongue: English
Weight: 151 KB
Volume: 1
Category: Article
ISSN: 1751-8601
DOI: 10.1049/iet-cdt:20060120

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