Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits

✍ Scribed by Abderrahman, A.; Cerny, E.; Kaminska, B.

• Book ID: 119778434
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 509 KB
• Volume: 18
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.748163