Work function measurements during a growth of ultra thin films of SiO2 on characterized silicon surfaces : C. Raisin, E. Vieujot-Testemale, A. Ben Brahim, J. M. Palau and L. Lassabatere. Solid St. Electron.27, 413 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 124 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90163-5