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Work function measurements during a growth of ultra thin films of SiO2 on characterized silicon surfaces : C. Raisin, E. Vieujot-Testemale, A. Ben Brahim, J. M. Palau and L. Lassabatere. Solid St. Electron.27, 413 (1984)


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
124 KB
Volume
25
Category
Article
ISSN
0026-2714

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