[Widerkehr & Associates 1996 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (11-13 June 1996)] 1996 Symposium on VLSI Technology. Digest of Technical Papers - Random MOSFET parameter fluctuation limits to gigascale integration (GSI)

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✍ Wann, C.H.; Tu, R.; Bin Yu, ; Chenming Hu, ; Noda, K.; Tanaka, T.; Yoshida, M.; 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 257 KB

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✍ Tahui Wang, ; Tse-En Chang, ; Lu-Ping Chiang, ; Chimoon Huang, ; Guo, J.C. 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 215 KB

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✍ Assaderaghi, F.; Shahidi, G.G.; Hargrove, M.; Hathorn, K.; Hovel, H.; Kulkarni, 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 228 KB

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✍ Haddad, S.; Vei-Han Chan, ; Hao Fang, ; Yuan Tang, ; Ramsbey, M.; Wang, A.; Yu S 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 202 KB

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✍ Yoshitomi, T.; Ohguro, T.; Saito, M.; Ono, M.; Morifuji, E.; Momose, H.S.; Iwai, 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 276 KB

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✍ Jallepalli, S.; Bude, J.; Shih, W.K.; Pinto, M.R.; Maziar, C.M.; Tasch, A.F. 📂 Article 📅 1996 🏛 Widerkehr & Associates ⚖ 198 KB