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[Widerkehr and Associates 2004 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (17-19 June 2004)] 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) - On-die CMOS leakage current sensor for measuring process variation in sub-90nm generations

✍ Scribed by Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.K.; Borkar, S.

Book ID: 126758368
Publisher: Widerkehr and Associates
Year: 2004
Weight: 166 KB
Category: Article
ISBN-13: 9780780382879
DOI: 10.1109/VLSIC.2004.1346576

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