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[Widerkehr and Associates 2004 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (17-19 June 2004)] 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) - SRAM design on 65nm CMOS technology with integrated leakage reduction scheme

✍ Scribed by Zhang, K.; Bhattacharya, U.; Chen, Z.; Hamzaoglu, F.; Murray, D.; Vallepalli, N.; Wang, Y.; Zheng, B.; Bohr, M.

Book ID: 120275370
Publisher: Widerkehr and Associates
Year: 2004
Weight: 172 KB
Category: Article
ISBN-13: 9780780382879
DOI: 10.1109/VLSIC.2004.1346592

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