๐”– Bobbio Scriptorium
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White beam, X-ray, energy-dispersive diffractometry using synchrotron radiation

โœ Scribed by B. Buras; J.Staun Olsen; L. Gerward

Publisher
Elsevier Science
Year
1978
Weight
252 KB
Volume
152
Category
Article
ISSN
0029-554X

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โœ Chen, W.M. ;McNally, P.J. ;Shvydko, Yu.V. ;Tuomi, T. ;Lerche, M. ;Danilewsky, A. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 162 KB ๐Ÿ‘ 1 views

The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering