What determines the probing depth of electron yield XAS?
✍ Scribed by S.L.M. Schroeder; G.D. Moggridge; R.M. Ormerod; T. Rayment; R.M. Lambert
- Book ID
- 116066603
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 506 KB
- Volume
- 324
- Category
- Article
- ISSN
- 0039-6028
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## Abstract Two series of experiments on well‐characterized systems were performed to examine the probing depth of soft x‐ray absorption spectroscopy (XAS) measured in total‐electron‐yield (TEY) mode. First we measured the Ni 2~p~~3/2~ absorption spectra of Ni(100) covered with Tb as a function of
Calibration of the probing depth by x-ray absorption spectroscopy (XAS) in oxide materials is intended by measurement of the total electron yield (TEY) of electrons ejected by absorption of the radiation. Measurements have been carried out for three series of electrolytic metal oxide overlayers with