Calibration of the Probing Depth by Total Electron Yield of EXAFS Spectra in Oxide Overlayers (Ta2O5, TiO2, ZrO2)

✍ Scribed by Jiménez, V. M.; Caballero, A.; Fernández, A.; Sánchez-López, J. C.; González-Elipe, A. R.; Trigo, J. F.; Sanz, J. M.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 371 KB
• Volume: 25
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199708)25:9<707::aid-sia290>3.0.co;2-e

✦ Synopsis

Calibration of the probing depth by x-ray absorption spectroscopy (XAS) in oxide materials is intended by measurement of the total electron yield (TEY) of electrons ejected by absorption of the radiation. Measurements have been carried out for three series of electrolytic metal oxide overlayers with di †erent thickness. The experiments have been conducted at the Ti K, Ta and Zr K edges. Analysis of the XAS spectra is carried out by factor L III analysis and conventional Fourier transformation and Ðtting analysis. The data showed that the information depth by XAS follows the order at the Ti K, Ta and Zr K edges.

L III As an alternative, the absorption spectra of the same samples were measured in the conversion electron yield (CEY) mode : i.e. by measuring the current of He' ions produced by the ejected electrons in an atmosphere of He in contact with the sample. Here, the information depth is slightly di †erent from that obtained by TEY.

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