More accessible accounts of this work may he found in, for example, [lX, Chap. 4, Section 41 and [19, Chap. Vl where, in addition, similar questions are treated with roughly the same methodology. A wealth of related material can also he found in [201.
Wavelets and their applications for surface metrology
โ Scribed by X. Jiang; P. Scott; D. Whitehouse
- Publisher
- International Academy for Production Engineering
- Year
- 2008
- Tongue
- English
- Weight
- 800 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0007-8506
No coin nor oath required. For personal study only.
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