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Metrological characteristics of wavelet filter used for engineering surfaces

✍ Scribed by K. Lingadurai; M.S. Shunmugam

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
817 KB
Volume
39
Category
Article
ISSN
0263-2241

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✦ Synopsis

The functional behavior of manufactured surfaces is influenced by the errors such as roughness, waviness and form errors that are present on the surface. A filtering process is used to establish a three-dimensional reference surface consisting of waviness and form errors and the roughness component is separated with reference to it. The metrological characteristics of a filter are better understood in terms of wavelength content and phase information. In this paper, metrological characteristics of wavelet filter suggested for processing of engineering surfaces are discussed. A few typical manufactured surfaces and their reference surfaces established by wavelet filter are further analyzed by random process techniques to bring out the waviness content and phase matching.

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