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Wavelet analysis for classification of multi-source PD patterns

โœ Scribed by Lalitha, E.M.; Satish, L.


Book ID
118070524
Publisher
IEEE
Year
2000
Tongue
English
Weight
735 KB
Volume
7
Category
Article
ISSN
1070-9878

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A multi-layer perceptron pattern classifier is defined for wavelet map interpretation and its application is described as a tool for mechanical fault detection. As a key step, an instantaneous scale distribution is introduced for quantifying pattern features. Instead of directly inspecting complicat