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Wavelength demultiplexer using the spatial dispersion of multilayer thin-film structures

โœ Scribed by Gerken, M.; Miller, D.A.B.


Book ID
119800488
Publisher
IEEE
Year
2003
Tongue
English
Weight
280 KB
Volume
15
Category
Article
ISSN
1041-1135

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The damage probability and damage morphology of the multilayer dielectric films under two wavelengths simultaneous irradiation are investigated. The damage morphology result shows that both pit number and depth caused by simultaneous 1ฯ‰ and 3ฯ‰ irradiation increase sharply compared with 3ฯ‰ irradiatio