Electrical characterization and reliabil
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J. V. Manca; K. Croes; L. de Schepper; W. de Ceuninck; L. M. Stals; L. Jacques;
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Article
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1998
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John Wiley and Sons
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English
⚖ 123 KB
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The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating expe