Voltage stress-induced hot carrier effects on SiGe HBT VCO

✍ Scribed by Chuanzhao Yu; Enjun Xiao; J.S. Yuan

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 407 KB
• Volume: 45
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2005.07.026