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Visualization of Bonghan Microcells by Electron and Atomic Force Microscopy

✍ Scribed by Ku Youn Baik; Vyacheslav Ogay; Sae Chae Jeoung; Kwang-Sup Soh

Book ID
119646837
Publisher
Elsevier
Year
2009
Tongue
English
Weight
815 KB
Volume
2
Category
Article
ISSN
2005-2901

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The surface structure of SnSe was studied by atomic force microscopy (AFM). The measured periodicities in the ( 100) and ( 101) planes as obtained from AFM images are consistent with those derived from the theoretical SnSe crystalline cell. The slight di4erences observed are the likely result of sur