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Visualization and Characterization of Poly(amidoamine) Dendrimers by Atomic Force Microscopy

✍ Scribed by Li, J.; Piehler, L. T.; Qin, D.; Baker, J. R.; Tomalia, D. A.; Meier, D. J.

Book ID
121015825
Publisher
American Chemical Society
Year
2000
Tongue
English
Weight
178 KB
Volume
16
Category
Article
ISSN
0743-7463

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The surface structure of SnSe was studied by atomic force microscopy (AFM). The measured periodicities in the ( 100) and ( 101) planes as obtained from AFM images are consistent with those derived from the theoretical SnSe crystalline cell. The slight di4erences observed are the likely result of sur