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VIB-3 defect structure and electrical property modifications caused by reactive ion etching and ion beam etching

✍ Scribed by Fonash, S.J.; Singh, R.; Climent, A.; Rohatgi, A.; Choudhury, P.R.; Caplan, P.; Poindexter, E.


Book ID
114594620
Publisher
IEEE
Year
1983
Tongue
English
Weight
206 KB
Volume
30
Category
Article
ISSN
0018-9383

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