VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs

✍ Scribed by Hsu, F.-C.; Ko, P.K.; Tam, S.; Hu, C.; Muller, R.S.

• Book ID: 114594276
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 207 KB
• Volume: 29
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1982.20998