𝔖 Bobbio Scriptorium

✦ LIBER ✦

Very sensitive detection for LSI's hot spot using liquid crystal : Masara Sanada. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 53 (2–4 June 1987)

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 121 KB
Volume: 29
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(89)90467-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Durability of floppy disks : Shinji Sugi

Durability of floppy disks : Shinji Sugimoto. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 45 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 258 KB

Microfluorescence analysis of photoresis

Microfluorescence analysis of photoresists and contaminants in LSI processing : S. Koyata, C. Niwano and T. Hattori. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 17 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 140 KB

Reliability assurance on purchased elect

Reliability assurance on purchased electronic components : Nobutoyo Tsutsumi and Hiroaki Yasuda. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 15 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 135 KB

Bayesian inference on parameter of expon

Bayesian inference on parameter of exponential distribution and its characteristics : Michio Horigome. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 27 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 125 KB

hFE shift on the reverse bias test for e

hFE shift on the reverse bias test for emitter-base junction : Tatsuya Tominago and Tetsuaki Wada. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 37 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 133 KB

The effects of heat sinking on THB testi

The effects of heat sinking on THB testing of ICs : Yasuhiro Mizogami, Kusuya Iwasaki and Keiichi Ohtani. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 35 (2–4 June 1987)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 259 KB