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The effects of heat sinking on THB testing of ICs : Yasuhiro Mizogami, Kusuya Iwasaki and Keiichi Ohtani. Proceedings of the 17th Symposium on Reliability and Maintainability, Union of Japanese Scientists and Engineers, 35 (2–4 June 1987)

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 259 KB
Volume: 29
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(89)90376-4

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