Vertical resistive transition in SiNb multilayers
โ Scribed by S.N. Song; J.B. Ketterson
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 177 KB
- Volume
- 165-166
- Category
- Article
- ISSN
- 0921-4526
No coin nor oath required. For personal study only.
โฆ Synopsis
The vertical and in-plane resistive transition in a series of Si/Nb multilayers has been studied. An anisotropic percolation model is adequate to explain the observed transition behavior.
The measured temperature dependence of the supercurrent is compared with the Ambagaokar-Baratoff theory. The tail structure in Ifl) curves near T, is interpreted as the short coherence length effect.
๐ SIMILAR VOLUMES
## Abstract Four wideband vertical transitions between transmission lines for multilayer benzocyclobuteneโbased multichip module are presented for the first time. Their backโtoโback configurations are designed and fabricated. The RF transition characteristics are simulated, measured, and analyzed.
Rapid advances in information technology rely on high-speed and large-capacity nonvolatile memories. A number of alternatives to contemporary Flash memory have been extensively studied to obtain a more powerful and functional nonvolatile memory. We review the current status of one of the alternative
## Abstract We have observed a pronounced resistive memory effect with an on/off ratio of โผ2 in 3โaminopropyltrimethoxysilane (APTMS) molecular multilayers trapped with NH^+^~3~ ions. The APTMS multilayers were deposited on SiO~2~/Si(p^++^) substrates using a selfโassembly process and characterized