Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers

✍ Scribed by Kopanski, J. J.

• Book ID: 118070692
• Publisher: The Electrochemical Society
• Year: 1990
• Tongue: English
• Weight: 831 KB
• Volume: 137
• Category: Article
• ISSN: 0013-4651
• DOI: 10.1149/1.2086332