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Variational method applied to determine the lattice parameter profiles in semiconductor heterostructures

✍ Scribed by S.N. Santalla; C. Kanyinda-Malu; R.M. de la Cruz

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 356 KB
Volume: 41
Category: Article
ISSN: 1386-9477
DOI: 10.1016/j.physe.2009.05.007

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