Variation of interface trap level charge density within the bandgap of 4H-SiC with varying oxide thickness

✍ Scribed by SANJEEV K GUPTA; A AZAM; J AKHTAR

• Book ID: 107588912
• Publisher: Springer-Verlag
• Year: 2011
• Tongue: English
• Weight: 321 KB
• Volume: 76
• Category: Article
• ISSN: 0304-4289
• DOI: 10.1007/s12043-011-0023-5