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Variable-Latency Adder (VL-Adder) Designs for Low Power and NBTI Tolerance

โœ Scribed by Yiran Chen; Hai Li; Cheng-Kok Koh; Guangyu Sun; Jing Li; Yuan Xie; Roy, K.


Book ID
118163391
Publisher
IEEE
Year
2010
Tongue
English
Weight
406 KB
Volume
18
Category
Article
ISSN
1063-8210

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[ACM Press the 2007 international sympos
โœ Chen, Yiran; Li, Hai; Li, Jing; Koh, Cheng-Kok ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› ACM Press โš– 318 KB

Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) technique for NBTI tolerance. By detecting the circuit failure on-the-fly, the proposed VL-adder can automatically shift