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Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

✍ Scribed by Veal, T. D.; King, P. D. C.; Hatfield, S. A.; Bailey, L. R.; McConville, C. F.; Martel, B.; Moreno, J. C.; Frayssinet, E.; Semond, F.; Zúñiga-Pérez, J.

Book ID: 125446449
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 365 KB
Volume: 93
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3032911

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