Valence band offset of ZnO/4H-SiC heterojunction measured by x-ray photoelectron spectroscopy

✍ Scribed by Fan, H. B.; Sun, G. S.; Yang, S. Y.; Zhang, P. F.; Zhang, R. Q.; Wei, H. Y.; Jiao, C. M.; Liu, X. L.; Chen, Y. H.; Zhu, Q. S.; Wang, Z. G.

• Book ID: 111689120
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 540 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2926679