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Valence and conduction band offset measurements in Ni0.07Zn0.93O/ZnO heterostructure

✍ Scribed by Dar, Tanveer Ahmad; Agrawal, Arpana; Misra, Pankaj; Kukreja, Lalit M.; Sen, Pranay Kumar; Sen, Pratima


Book ID
121674234
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
626 KB
Volume
14
Category
Article
ISSN
1567-1739

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We investigate the suitability of Si 1-y C y for n-channel electronic devices by calculating the band offsets of Si 1-y C y layers grown on silicon. A reformulated tight binding method with measured spectroscopic term values is employed for calculation of valence band offsets. Calculation of conduct