𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Using of the Michelson Microwave Interferometer for the Measurement of Permittivity of Thin-Layer Materials

✍ Scribed by V. I. Borisov; A. V. Karpenko

Book ID
110327350
Publisher
SP MAIK Nauka/Interperiodica
Year
2001
Tongue
English
Weight
37 KB
Volume
37
Category
Article
ISSN
1061-8309

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Building a resonant cavity for the measu
Building a resonant cavity for the measurement of microwave dielectric permittivity of high loss materials
✍ C. P. L. Rubinger; L. C. Costa πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 202 KB

## Abstract The design of a cavity resonator implies to solve the Maxwell equations inside that cavity, respecting the boundary conditions. As a consequence, the resonance frequencies appear as conditions in the solutions of the differential equation involved. The measurement of the complex permitt

Measurement of complex permittivity of t
Measurement of complex permittivity of thin substrates using the TE01n resonant cavity
✍ Ming-Yan Chen; Jian-Ping Yu; De-Ming Xu πŸ“‚ Article πŸ“… 2004 πŸ› John Wiley and Sons 🌐 English βš– 112 KB

## Abstract An improved TE~01n~ resonant‐cavity method for measuring the complex permittivity of thin substrates is presented. The theory and the experimental results are described in this paper. Β© 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 274–277, 2004; Published online in Wiley