✦ LIBER ✦

Using fuzzy logic to detect dimple defects of polished wafer surfaces

✍ Scribed by Hua Li; Jen Chung Lin

Book ID: 117863543
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 621 KB
Volume: 30
Category: Article
ISSN: 0093-9994
DOI: 10.1109/28.287528

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

DETECTION OF ROLLER BEARING DEFECTS USIN

DETECTION OF ROLLER BEARING DEFECTS USING EXPERT SYSTEM AND FUZZY LOGIC

✍ T.I. Liu; J.H. Singonahalli; N.R. Iyer 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 278 KB

A fuzzy expert system, Bearing -Expert, has been developed. This expert system is PC-based. It is menu driven and it is very user-friendly. This expert system offers specific knowledge of various aspects about bearing monitoring, such as diagnostic methods, defect frequencies, feature selection, fuz

Investigation of surface and sub-surface

Investigation of surface and sub-surface defects on polished InP substrates using auger electron spectroscopy coupled to argon ion sputtering

✍ P. Ossart; E.V.K. Rao 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 771 KB

Use of positron annihilation measurement

Use of positron annihilation measurements to detect the defect beneath worn surface of stainless steel 1.4301 (EN) under dry sliding condition

✍ Dryzek, Jerzy; Horodek, Paweł; Wróbel, Mirosław 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 685 KB

Detecting defects in welded endless meta

Detecting defects in welded endless metal belts using two transversely located surface condition sensors connected differentially to overcome effect of weld : Meidensha KK European Patent No. 381,145 (8 Aug. 1990)

📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 187 KB

Detection and characterization of local

Detection and characterization of local defects on polished glass surfaces using differential interference contrast microscopy: Reschke, T. J.; Baumer, S. M.; Kross, J. SPIE — 16th Congress of the International Commission for Optics — Optics as a Key to High Technology, Bellingham, WA. Photo-Optical Instrumentation Engineers; 1993: 921–922. Vol. 1983 pt 2

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 131 KB