✦ LIBER ✦
Detection and characterization of local defects on polished glass surfaces using differential interference contrast microscopy: Reschke, T. J.; Baumer, S. M.; Kross, J. SPIE — 16th Congress of the International Commission for Optics — Optics as a Key to High Technology, Bellingham, WA. Photo-Optical Instrumentation Engineers; 1993: 921–922. Vol. 1983 pt 2
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 131 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0141-6359
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