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Use of Thermoelectronic Emission for Studying Point Defects in Refractory Oxides

✍ Scribed by J. C. RIFFLET; P. ODIER; A. M. ANTHONY; J. P. LOUP

Book ID: 110814059
Publisher: John Wiley and Sons
Year: 1975
Tongue: English
Weight: 566 KB
Volume: 58
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1975.tb18766.x

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